In the example given here, electron depth-dose distributions and
mass-stopping powers are computed via correlated sampling as a function of depth over a range
of angles of incidence.
Figure:
Restricted mass-collision stopping power ratios
(=100 keV) for water:silicon as a function of the angle of
incidence (top) and water:air (bottom) compared with a 5.395 MeV
electron beam according to ICRU-35 (circles) and the IPEM (triangles)
=100 keV) for water:silicon as a function of the angle of
incidence (top) and water:air (bottom) compared with a 5.395 MeV
electron beam according to ICRU-35 (circles) and the IPEM (triangles)